薄膜的

The CeO2 thin films were characterized by X-ray photoelectron spectroscopy and spectrometer, X-ray diffraction, Raman spectroscopy and scanning electron microscopy.

采用光电子能谱、X射线衍射、拉曼光谱和扫描电镜等测试方法表征薄膜的特性。

We also study the substrates influence on the films.

研究了不同衬底对ZnO薄膜的影响。

This thesis is consist of two chapter, In the first chapter of this paper, We study the preparation of Silica Sols and self-Assembled Thin Films.

本论文工作共分为两部分，在第一章我们开展了用静电自组装技术制备二氧化硅纳米复合薄膜的研究。

Leontis and Rhines and Markworth have also demonstrated the presence of MgA1204 in the surface oxide films on high A1-Mg alloys.

Leontis和Rhines和Markworth也证实存在MgA1204表面氧化物薄膜的高A1-Mg合金。

Infrared optical constants of PZT andTiO3 thin films on LaNiO3 bufferized platinized silicon wafers were obtained using infrared spectroscopic ellipsometer.

实验获得多种组分PZT和TiO3铁电薄膜的红外光学常数。

Surface morphology, hardness, bonding configuration and tribological properties were investigated by atomic force microscopy, nanoindenter, Raman spectra, FTIR spectra as well as a ball-on-disk test rig, respectively.

利用原子力显微镜、纳米压痕、拉曼光谱、红外光谱和摩擦磨损测试仪对薄膜的表面形貌、硬度、键结构以及摩擦性能做了具体分析。

The electrical properties, including surface resistance, volume resistance, breakdown strength and dielectric constant were researched mainly.

重点研究了薄膜的电性能，包括表面电阻、体积电阻、击穿强度以及介电常数等。

In this thesis, three vapour deposition techniques are adopted to prepare vanadium oxide thin films with high TCR for uncooled IR detectors.

本论文是利用多种物理气相沉积方法制备具有高TCR红外探测器用氧化钒薄膜的研究。

The electrochemical corrosion behaviors of indium tin oxide films were investigated by electrochemical methods in sodium hydroxide solutions.

通过循环伏安法等方法研究了氧化铟锡透明导电薄膜的电化学行为。

A novel method to synthesize single-walled carbon nanotube films with large area and high purity was introduced.

介绍了一种制备大面积高纯度单壁碳纳米管薄膜的新方法。

And Pharaoh spoke to Joseph, saying, Your father and your brothers have come to you.

47：5 法老对约瑟说，你父亲和你弟兄们到你这里来了。

Additionally, the approximate flattening of surface strip using lines linking midpoints on perpendicular lines between geodesic curves and the unconditional extreme value method are discussed.

提出了用测地线方程、曲面上两点间短程线来计算膜结构曲面测地线的方法，同时，采用测地线间垂线的中点连线和用无约束极值法进行空间条状曲面近似展开的分析。