薄膜

Hydrogenated amorphous silicon nitride films have been deposited by helicon wave plasma enhanced chemical vapor deposition, the effect of SiH4/N2 rate on the properties of the samples is systematically studied, and the critical experiment condition is obtained under which a-SiNx:H films with different compositions are deposited.

本工作采用螺旋波等离子体化学气相沉积方法制备了氢化非晶氮化硅薄膜，系统地研究了不同反应气体配比对薄膜特性的影响，得到了沉积不同组分a-SiN_x：H的典型实验条件。

The epitaxial ZnO films are prepared on Al2O3 substrates by using helicon wave plasma assisted sputtering technique. The as-grown and annealed films showed different in-plane orientations.

采用螺旋波等离子体辅助溅射沉积法在衬底Al2O3的(0001)面上沉积ZnO薄膜，所生长的薄膜在未退火和退火时表现出不同的平面内取向。

The microstructure observationsreveal that very homogeneous materials are obtained without abnormal grain growthand free of defects and with homogeneous distribution of Al species.

在薄膜的制备中，基底温度的提高对于AZO薄膜导电性和透过率的提高有明显的促进作用。

We also take a series of testing on Raman spectra, which analyzing the situation in different hot wire temperature and different anneal process.

本论文对a-Si：H 薄膜进行了一系列的喇曼测试，并针对热丝温度以及不同退火条件下薄膜的喇曼谱图进行了分析。

All films were deposited by spin-coating at 2000 rpm, hotplate drying at 60 °C and annealed in air at 450 °C. It was observed that all films were polycrystalline in nature with a hexagonal wurtzite structure.

全部 薄膜沉积的旋涂法在2000年的rpm ，炉具干燥，在60 ° C和空气中退火450 ° C的有人所有多晶硅薄膜的性质六角纤锌矿结构。

This paper reviews recent developments in the design and assembly of hydrogenase-modified electrodes, wherein the enzyme was immobilized by physical adsorption, self-assembly, sol-gel and Langmuir-Blodgett methods. Electrochemical properties of hydrogenase in the molecular assemblies and biohydrogen production are discussed.

本文综述了氢酶及其分子聚集体薄膜在电极表面的组装技术，如吸附法、自组装法、Langmuir-Blodgett法和溶胶－凝胶法等，并讨论了分子聚集体薄膜中氢酶的结构、生物活性、电化学性质及其在催化产氢方面的应用。

But it is inadvisable to adopt too high substrate temperature.

基片温度的增加可以使薄膜的晶粒长大，改善薄膜的光电性能。

The measuring conditions of thin films thickness with grazing incident X ray is explained, and interferential principle and method of thickness measurement of multilayer thin films by grazing incident X ray are analyzed.

阐述了掠入射X射线测量薄膜厚度的条件，讨论和分析了掠入射X射线测量多层薄膜厚度的干涉原理和方法。

As the film sample is fixed on one plane by tighten bolt,this device can realize the deflection of optical path.And the reflectivity of the sample is measured by using oblique incident ray.

使用该装置并通过平面和样品背后的顶丝固定薄膜样品的安装方式，可实现光路转折，完成斜入射光对薄膜样品反射率的测量。

It was found that the transparence of CdS film increased with the increment of the thickness of it.

透光率的研究表明，随着CdS薄膜厚度的增加，薄膜的光吸收增加。

For a big chunk of credit-card losses; the number of filings (and thus charge-off rates) would be rising again, whether

年美国个人破产法的一个改动使得破产登记急速下降，而后引起了信用卡大规模的亏损。

Eph. 4:23 And that you be renewed in the spirit of your mind

弗四23 而在你们心思的灵里得以更新