原告

Atomic force microcopy, transmission electron microcopy, X-ray diffraction and electron probe are applied to study the microstructure, morphology and chemical composition of the chips, either as-implanted or annealed at different temperatures. It was found that the as-implanted Zn atoms aggregate into clusters scattering about 35 nm beneath the surface of the chips.

利用电子探针、薄膜X射线衍射仪、原子力显微镜和透射电子显微镜，对注入和热氧化后的薄膜成分、表面形貌和微观结构进行表征，探讨了热氧化温度以及注入剂量对纳米ZnO团簇的成核过程及生长行为的影响。

You c a n count on one thing, baby .

你可以相信一件事，宝贝