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The obtained pillared saponite was characterized by X-ray powder diffraction, FT-IR and TG-DTA.

实验对于该铝柱皂石进行了粉末XRD，FT-IR和TG-DTA表征。

Based on the adaxial matrix optics and scalar quantity diffraction integral theory, the principle of this system is analyzed, and optimum design of the system parameters and numerical calculations for this system are presented in detail.

应用矩阵光学、衍射积分理论，详细分析了它的工作原理，给出了系统优化设计参数和详细的数值计算结果。

The structure light 3-D measurement system is based on the structure light scanning binocular vision measurement of machine vision diffraction grating code principle technology.

本文提出的结构光面扫描三维测量系统是基于机器视觉光栅编码原理的结构光扫描双目视觉测量技术。

The ability of agent EDTA controlling the particle size was also discussed.The phase, structure and surface topography were analysised by X-ray diffraction, transmission electron microscope and scansion electron microscope.

用X射线衍射分析、透射电子显微镜、扫描电子显微镜对样品进行物相、结构和形貌分析，确定制备的样品均为六方晶相。

The microstructure and interface of plasma-sprayed Al2O3 ceramic coatings on 45# steel have been investigated by means of x-ray diffraction, scanning electron microscope and microscope sclerometer.

用X射线衍射、扫描电镜和显微硬度计研究了45钢表面等离子喷涂 Al2O3陶瓷涂层的微观组织结构、显微硬度，同时对涂层的界面结合特性进行了考察。

To minimize harmful diffraction effects, the secondary, or diagonal, mirror is generally only large enough to let the central portion of the focal plane receive light from the whole primary mirror.

为减小不利的衍射效应，副镜，或平面镜的大小只是刚够把主镜在焦平面的像反射就行了。

X-ray diffraction was used to analyze the crystal structure and the field-emission scanning electron microscopy inspected the surface and cross-sectional morphology. X-ray photoelectron spectroscopy is used to determine the film composition. The optical transmittance, electric resistance, Hall Effect, and Seebeck coefficient were measured. It was found in XRD patterns that all samples possess In2O3 structure.

在特性量测方面，分别以X光绕射分析其晶体结构，场发射扫瞄式电子显微镜分析其表面及断面型态，以X光电子能谱分析仪分析薄膜成份，并搭配光穿透率、电阻率、霍尔效应及Seebeck系数等特性分析，探讨经热处理之后薄膜的热电特性变化。

The composition of the SiGe thin films were controlled by changing the ratio of the area of silicon and germanium. By changing the parameters of substrate temperature and annealing temperature, we examined the microstructure, composition, crystallinity, electrical and thermoelectric properties by field emission scanning electron microscope, X-ray photoelectric spectroscopy, secondary ion mass spectrometer, X-ray diffraction, Hall effect and Seebeck coefficient measurement.

利用改变矽锗靶材面积比例进行薄膜成份的控制，并藉由改变基板温度以及退火温度之制程参数，利用场发射扫描式电子显微镜、化学分析电子能谱仪、二次离子质谱仪、X光绕射仪、霍尔效应量测仪以及自组装之热电量测系统作为分析仪器，分别量测薄膜表面形貌、横截面、成分、结晶性质、电性以及Seebeck系数等特性。

The lattice relaxation in the CVD diamond thick films were detected by the X-ray diffraction attachments. It is associated with self-annealing of diamond thick films in the process of long time deposition. The wearing discrepancy of diamond coated cuttings and diamond thick films brazed cuttings is well illustrated by means of lattice relaxation.

用X射线衍射仪的薄膜附件测试分析金刚石厚膜内的晶格松弛现象，发现沉积金刚石厚膜过程中存在高温自退火的作用，运用晶格松弛的观点很好地解释了金刚石薄膜涂层刀具与厚膜钎焊刀具的耐磨性能差异。

The X-ray diffraction results of corrosion products and scanning electron microscopy analysis of corrosion surface were used to comparatively investigate the corrosion properties of Zn/Al coatings, and to study the self-sealing mechanism.

研究表明，与纯锌、纯铝涂层相比，对于钢基体，锌铝复合涂层具有更加合适的阴极保护电位，可以大大提高防护寿命；海水环境中涂层表面会形成一层致密稳定的腐蚀产物膜，能有效阻止腐蚀介质向涂层内部的渗透，涂层会保持在一个较低的腐蚀速度。

And Pharaoh spoke to Joseph, saying, Your father and your brothers have come to you.

47：5 法老对约瑟说，你父亲和你弟兄们到你这里来了。

Additionally, the approximate flattening of surface strip using lines linking midpoints on perpendicular lines between geodesic curves and the unconditional extreme value method are discussed.

提出了用测地线方程、曲面上两点间短程线来计算膜结构曲面测地线的方法，同时，采用测地线间垂线的中点连线和用无约束极值法进行空间条状曲面近似展开的分析。