scan widely

scan widely的基本解释

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放眼

与scan widely相关的网络例句 [注：此内容来源于网络，仅供参考]

Scan widely looks, it is the hopeful event that counts decuple, several centuple growth about fortune entirely.

放眼一望，全部是关于财富数十倍、数百倍增长的乐观事件。

Trade of scan widely 3C is inside, such " saliva battles " never come to nothing: For instance, be faced with copper before air conditioning a few years to rise in price when pressure, had appeared " aluminous acting copper " technology, but this is called by the competitor however " black heart copper pipe ", around move copper pipe is true " black heart ", two big group call each other names between public opinion intense; Be like again, sell in chain, the eye looks at global economy crisis to come, chain door storefront faces capital to drop the risk of catenary, a large chain says frankly can close the door store with only store bad beneficial result moderately, another main competitor sees situation give off the rumour that wants reopen inn a hunderd schools however...

放眼3C行业内部，这样的"口水仗"永不落空：比如，空调前几年面临铜涨价压力时，出现过"铝代铜"的技术，但这却被竞争对手称为"黑心铜管"，围绕着铜管是不是真的"黑心"，两大派别在舆论当中对骂激烈；又如，在连锁卖场，眼看着全球经济危机来临，连锁门店面临资金掉链的风险，一家大型连锁坦言会适度关闭单店效益不好的门店，而另一家主要竞争对手见势却放出要再开店百家的风声

Some methods aiming at the two problems have been researched. First, the optimal number of ATE site can be calculated based on a cost model of DAT-ATE. Second, the problem of test schedule which is equitant with two-dimensional Bin-Packing problem is presented. Then a TCG denotation satisfied with T-admissible rule is more convenient for combinational optimization. With Simulated annealing algorithm, better test scheduling results can be achieved; but there is no great optimization space because the efficiency of scheduling is greater than 90%. Third, A novel test compression method——Multi-capture testing is proposed to compress the stimuli. And the ATPG results show that MC achieves high compression ratio which is greater than 90% in some large-scale circuits. MISR, widely used in LBIST, is employed to compress the responses. The aliasing analysis demonstrates that the fault coverage reduction is little due to the existence of aliasing. Fourth, an improved TIC (called S-TIC) aiming at structured test is proposed based on ARM's TIC. A MC scheduling algorithm is proposed to compute the SoC test time and combine MC vectors to SoC test vectors. The scheduling results shows that test time is greatly reduced when using the proper scheduling priority.

首先，给出了低成本ATE的成本模型，根据此模型得到最低测试成本时系统级测试调度的基本参数——测试Site数；其次，本文将DAT-Scan方式的SoC测试调度等价为两维BP问题，为有效地求解该问题，将该BP问题表示为TCG图并通过模拟退火算法解决其求解过于复杂的问题，调度的结果表明该方法在测试时间上有一定改善，并指出DAT-Scan测试调度效率已经大于90％，进一步优化的空间较小；第三，本文尝试通过测试压缩来解决激励所需的测试带宽，提出了Multi-capture结构并解决了MC测试过程中的&矢量&退化问题，MC测试的ATPG结果表明其测试压缩率很高（大电路接近90％）；第四，在激励获得很高压缩比的情况下，测试响应也需压缩，本文采用LBIST中常用的MISR作为MC测试的响应压缩电路，理论分析和实验结果都证明了MC测试的别名对故障覆盖率影响较小（小于2％），并对两类别名的成因做了具体分析；第五，在MC测试及其响应压缩的基础上，本文改进了ARM公司的测试控制器TIC使之适合于MC测试，为了解决MC测试矢量合成问题，本文抽取了MC测试模型，通过固定优先级的MC测试调度模拟将MC矢量合成为ATE矢量，并模拟出了总的MC测试时间。