flourier

与flourier相关的网络例句 [注：此内容来源于网络，仅供参考]

The content involves Digital Filter, Auto Correlation, Cross Correlation, mean and standard deviation, probability density and probability distribution statistic, as well as Auto Power Spectrum based on Fast Flourier Transfer, Correct Power Spectrum, Cestrum and Frequency Response. The Short-time Flourier Transfer and Wavelet Transfer are included in the analysis program.

具体内容包括：数字滤波、时域加窗、自相关计算与互相关处理、均值和方差计算、概率密度和概率分布统计，快速傅立叶变换基础上的自功率谱、互功率谱、频率响应函数、相关函数、倒频谱分析；基于短时傅立叶分析的联合时频分析、小波变换等。

The concept of epoch difference is used to solve the unknown of antenna multiply figure, and to get the degree of multipath error by using Flourier transformation and nonlinear minimized square theory are analyzed, and good results are researched.

将历元差分的概念引如到解决天线增益图的不可知上，采用傅立叶变换和非线性最小二乘理论来解算多路径误差的大小，取得了一定的效果。

First of all two-dimensional bar code of the positioning and segmentation algorithm using Hough Transform and Sobel edge detection of the bar code images collected from the original image to effectively separate and then analyzes the barcode image through the optical system of the noise model, put forward a Calculation of point spread function of standard deviation of the algorithm uses Flourier transform adaptively select the threshold to remove noise caused by invalid border, bar code and thus be the basic module.

首先探讨了二维条码的定位与分割算法，利用Hough变换与Sobel边缘检测把条码图像从原始采集的图像中有效地分割出来然后分析了条码图像经过光学系统的噪声模型，提出了一种计算点扩展函数标准方差的算法采用Flourier变换自适应地选取阈值去除噪声导致的无效边界，从而得到条码的基本模块。

The annealing behavior of V_2 in CZSi introduced by fast neutron irradiation was investigated by Flourier infrared spectrometric analyzer, and the effect of the dose of the fast neutron irradiation on the formation of V_2 was also studied in detail.

通过傅立叶红外光谱仪技术研究了由快中子辐照直拉硅中引入的辐照缺陷——双空位(V2)退火行为，主要研究了不同中子辐照剂量对双空位的影响。

The isothermal anneal at an elevated temperature of 1150℃ ramped up from a starting temperature （600-1000℃） was employed to enable the growth of the grown-in oxygen precipitates that are larger than the critical size at the starting temperature. Flourier transformation infrared spectroscopy and scanning infrared microscopy are used to measure the amount of precipitated oxygen and the oxygen precipitate density in a 300mm nitrogen-doped Czochralski silicon wafer, respectively.

文章摘要：采取从某一温度（600-1000℃）开始缓慢升温至高温（1150℃）并保温若干时间的方法，使得直拉si片中大于起始温度对应的氧沉淀临界尺寸的那一部分原生氧沉淀得以长大，然后通过傅里叶红外光谱测量氧浓度变化以及利用扫描红外显微术测量氧沉淀密度。